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FOCUSED SESSION 2: Image based Characterization and Modelling of Ceramics by Non-destructive Examination Techniques

 

Image based characterization techniques as such SEM, light microscopy, TEM and FIB-tomography as well as Micro-tomography have gain an increase in resolution and speed in the past ten years which make them suitable for microstructural characterization on micro- and nanometer length scale. Techniques as µCT, FIB/TEM-Tomography, SEM/AFM/Ultrasonic microscopy as well as Digital Image Correlation (DIC), Acoustic Emission  and High Energy X-ray synchrotron and high performance computing enables an insight 3D view from materials to inspect or detect relative local microstructural changes and damage characteristics. A correlation and synchronization between the sensitivity of this several types NDE-techniques will close the length scale gap. Thus physical properties are highly effected by microstructure features (inhomogeneity as e.g. porosity, grain borders, inclusions) their size, dimension, shape and orientation have to be taken into account. Providing microstructure based models derived from mentioned characterization tools for modeling and simulation will lead to a detailed real structure length scale depending modeling. Representative volume and volume of interest (VOI) are of particular importance to link model and experiment for verification.

 

Proposed Session Topics

  • Influence of inhomogeneity on mechanical, chemical, electrical and thermal properties
    and the estimations
  • Characterization NDE technologies for defect extraction, shape calculation, grain orientation      and void distribution by 3D-model data acquisition
  • Analysis of sintering and solidification based on image based models
  • Verification of model by experiment and vice versa
  • Optimized microstructures designed and simulated by topographies
  • Strain characterization by digital image correlation technique
  • Length scale depending modelling based on evaluated structural data

 

Symposium Organizers

  • Dr. Tobias Fey, Friedrich-Alexander-University Erlangen-Nürnberg, Germany, tobias.fey@fau.de
  • Dr. You Zhou, National Institute of Advanced Industrial Science and Technology (AIST),              you.zhou@aist.go.jp
  • Prof. Surojit Gupta, Dept. of Mechanical Engineering, University of North Dakota              Surojit.gupta@engr.und.edu
  • Prof. Satoshi Tanaka, Nagaoka University of Technology, stanaka@vos.nagaokaut.ac.jp
  • Dr. Rousseau Benoît, University of Nantes, benoit.rousseau@univ-nantes.fr
  • Dr. Ulf Betke, Otto-von-Guericke University, u.betke@ovgu.de
  • Dr. Amjad Almansour, NASA, Glenn Research Center

 

Point of Contact

 


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