thin film measurement

Terahertz measurement technique resolves individual layer thickness within multilayer coatings

By April Gocha / July 15, 2016

Scientists at University of Kaiserslautern and Fraunhofer Institute for Physical Measurement Techniques in Kaiserslautern, Germany, have developed a technique that uses time of flight measurements from terahertz pulses to resolve individual layers within multilayered surfaces—now all the way down to 4 micrometers.

Read More