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Focused Session 2: Tomography and microscopy based modeling of ceramics

Characterization techniques as tomography and microscopy have gained an increase in resolution and speed in the past ten years which make them suitable for microstructural characterization on micro- and nanometer length scale. Techniques as μCT, TEM-Tomography, SEM/AFM/Ultrasonic microscopy as well as synchrotron and high performance computing enables an insight 3-D view from materials. Thus, physical properties are highly effected by microstructure features (inhomogenities as e.g. porosity, grain borders, inclusions) their size, dimension, shape and orientation have to be taken into  account. Providing microstructure based models derived from mentioned characterization tools for modeling and simulation will lead to a detailed real structure length scale depending modeling. Representative volume and volume of interest (VOI) are of particular importance to link model and experiment for verification.

 

Proposed session topics

  • Influence of inhomogeneity on mechanical, chemical, electrical and thermal properties and the estimations
  • Characterization technologies for defect extraction, shape calculation, grain orientation and void distribution by 3-D model data acquisition
  • Analysis of sintering and solidification based on image based models
  • Verification of model by experiment and vice versa
  • Optimized microstructures designed and simulated by topographies
  • Strain characterization by digital image correlation technique
  • Length scale depending modeling based on evaluated structural data

 

Symposium organizers

  • Tobias Fey, Friedrich-Alexander-University Erlangen-Nürnberg, Germany; tobias.fey@fau.de
  • Yasuo Kogo, Tokyo University of Science, Japan
  • You Zhou, National Institute of Advanced Industrial Science and
    Technology (AIST), Japan
  • Satoshi Tanaka, Nagaoka University of Technology, Japan
  • Michael Scheffler, Otto-von-Guericke University, Germany
  • Alberto Ortona, SUSPI, Switzerland
  • Lorenzo Valdevit, University of California, Irvine, USA

 


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