Nathan (Nate) D. Orloff, Project Leader of the Microwave Materials Project in the Communications Technology Laboratory at National Institute of Standards and Technology (NIST) in Boulder, Colorado, USA.

Abstract

Orloff’s research focuses on standards, materials-by-design for communications, 5G standard reference materials, on-wafer materials metrology, and bridging the gap between optical and microwave on-wafer measurement science.

Dr. Orloff earned a B.S. with high honors and Ph.D. in physics from the University of Maryland (UMD) at College Park, College Park, MD, USA, in 2004 and 2010, respectively. In 2011, he was a Dean’s Fellow with the Department of Bioengineering, Stanford University. In 2013, he joined the Materials Measurement Laboratory, Gaithersburg, MD, USA, as a Rice University Postdoctoral Fellow. In 2014, he joined the Communications Technology Laboratory at NIST in Boulder Colorado.

In 2020, the Department of Commerce selected Dr. Orloff for a Bronze Medal, recognizing his innovations in dielectric measurement. Dr. Orloff is the 2019 Karl Schwartzwalder-Professional Achievement in Ceramic Engineering Award from the American Ceramic Society. He has published about seventy peer-reviewed articles and proceedings. He holds a U.S. Patent on measuring material properties in roll-to-roll manufacturing, and a provisional patent on scanning waveguide ellipsometry.

 

 

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