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Video: Scanning tunneling microscope gets upgrade that could enable atomic-scale fabrication

By April Gocha / March 7, 2018

In an effort to improve the scanning tunneling microscope, researchers at the University of Texas at Dallas have pinpointed the problem that allows the microscope’s probe tip to crash into the sample it’s scanning and have devised a way to prevent it from happening.

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Terahertz measurement technique resolves individual layer thickness within multilayer coatings

By April Gocha / July 15, 2016

Scientists at University of Kaiserslautern and Fraunhofer Institute for Physical Measurement Techniques in Kaiserslautern, Germany, have developed a technique that uses time of flight measurements from terahertz pulses to resolve individual layers within multilayered surfaces—now all the way down to 4 micrometers.

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Other materials stories that may be of interest

By April Gocha / December 31, 2014

Colorful ultrathin semiconductor coatings, intelligent glass modules for building façades, and other materials stories that may be of interest for December 31, 2014.

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