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Dinesh Shetty

FEA and ‘weakest link’ analysis of dielectric strength of polycrystalline alumina

By Eileen De Guire / November 19, 2013

A representative “puncture” caused by dielectric breakdown of the alumina. A surface pit formed by grain pull-out is circled red, although there are clearly many. (Credit: Shetty, et al; Wiley.)  If you expect something to break, there are two things you want to know—when and how bad. Anyone who has broken a bone, for example,…

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