Mikhail Kats

New ultrathin VO2 film device perfectly, reproducibly absorbs infrared light

By Eileen De Guire / December 3, 2012

Left: This diagram shows the experimental setup used for measuring the reflectivity of the vanadium-sapphire device. The vanadium oxide layer is only 180 nanometers thick, much thinner than the wavelength of the incident infrared light. Right: At just the right temperature (light blue line), the reflectivity of the device drops almost to zero (99.75% absorbance)…

Read More