Rebecca Sichel-Tissot

New in the Jan-Feb ACerS Bulletin—Testing and characterization of ceramics

By Eileen De Guire / December 21, 2012

On the cover: Cai Zhonghou, beamline scientist at the Advanced Proton Source at Argonne National Laboratory loads a sample into an X-ray nanodiffractometer stage. The cover story reports on the use of the APS to characterize piezoelectric thin films in situ. Credit: W. Agresta; ANL. Happy New Year! The January-February 2013 issue of ACerS’ Bulletin…

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