silver migration

Dielectric Properties and Reliability of Zn0.95Mg0.05TiO3+0.25TiO2 MLCCs with Different Pd/Ag Ratios of Electrodes

By / January 28, 2010

Volume 7 Issue 1, Pages 71 – 80 Ying-Chieh LeePublished Online: Nov 19 2008 12:52PM DOI: 10.1111/j.1744-7402.2008.02327.x ABSTRACT In order to study the micromechanism of silver migration that influences the dielectric properties and reliability of Zn0.95Mg0.05TiO3+0.25TiO2 (ZMT”) with 1 wt% 3ZnO-B2O3 multilayer ceramic capacitors (MLCCs), various silver (Ag)-palladium (Pd) ratios of conductors were used as…

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