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thin layers

Terahertz measurement technique resolves individual layer thickness within multilayer coatings

By April Gocha / July 15, 2016

Scientists at University of Kaiserslautern and Fraunhofer Institute for Physical Measurement Techniques in Kaiserslautern, Germany, have developed a technique that uses time of flight measurements from terahertz pulses to resolve individual layers within multilayered surfaces—now all the way down to 4 micrometers.

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2-D materials inch closer to unseating silicon’s semiconductor reign

By April Gocha / April 14, 2016

ORNL scientists report on a new processing technique that could help bring 2-D electronic devices to the forefront, establishing a “path to replace silicon as the choice for semiconductors in some applications,” according to an ORNL press release.

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