Scientists at University of Kaiserslautern and Fraunhofer Institute for Physical Measurement Techniques in Kaiserslautern, Germany, have developed a technique that uses time of flight measurements from terahertz pulses to resolve individual layers within multilayered surfaces—now all the way down to 4 micrometers.
Read More
ORNL scientists report on a new processing technique that could help bring 2-D electronic devices to the forefront, establishing a “path to replace silicon as the choice for semiconductors in some applications,” according to an ORNL press release.
Read More