TOF-SIMS

Animation: Time of flight secondary ion mass spectrometry

By Eileen De Guire / December 14, 2011

[flash https://ceramics.org/ceramictechtoday/wp-content/video/IonMass.flv w=400 h=225 mode=0 f={image=https://ceramics.org/ceramictechtoday/wp-content/video/ionmass.jpg&screencolor=0xFFFFFF}] Animation showing how time of flight secondary ion spectrometry works. Credit: ION-TOF, GmbH Surfaces are of critical importance in materials systems and devices. One…

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