TOF-SIMS Archives | The American Ceramic Society

TOF-SIMS

Animation: Time of flight secondary ion mass spectrometry

By Eileen De Guire / December 14, 2011

[flash https://ceramics.org/ceramictechtoday/wp-content/video/IonMass.flv w=400 h=225 mode=0 f={image=https://ceramics.org/ceramictechtoday/wp-content/video/ionmass.jpg&screencolor=0xFFFFFF}] Animation showing how time of flight secondary ion spectrometry works. Credit: ION-TOF, GmbH Surfaces are of critical importance in materials systems and devices. One very powerful tool for the analysis of surface and subsurface chemistry is time of flight secondary ion mass spectrometry, which offers ppm or better sensitivity,…

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