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Jon Ihlefeld

Jon Ihlefeld will be an Associate Professor of Materials Science and Engineering and Electrical and Computer Engineering at the University of Virginia in Charlottesville, Virginia starting in the fall of 2017. Prior, he was a Distinguished Member of the Technical Staff at Sandia National Laboratories in Albuquerque, New Mexico.


Jon received his B.S. degree, with Distinction, in Materials Engineering from Iowa State University (2002) and Ph.D. (2006) in Materials Science and Engineering from North Carolina State University. At NCSU he studied the integration of BaTiO3 thin films with base metal electrodes and ferroelectric scaling effects in Jon-Paul Maria’s group. He then joined the groups of Darrell Schlom and R. Ramesh at Penn State University and the University of California-Berkeley, respectively, as a Post-Doctoral Scholar where he studied the growth and semiconductor integration of BiFeO3 by molecular-beam epitaxy. He joined Sandia as a Senior (2008), Principal (2012), and Distinguished Member of the Technical Staff (2017). Jon has authored over 100 peer-reviewed publications, has been granted 9 U.S. patents, and has given over 30 invited presentations at international conferences and universities. He is the recipient of several awards, including the IEEE UFFC’s Ferroelectrics Young Investigator Award, an R&D 100 award, and Sandia’s Distinguished Mentorship, Up & Coming, and Mission Innovator Awards. He has served as the U.S. Technical and General Chairs for the US-Japan Seminars on Dielectrics and Piezoelectric Materials and is co-chair of the 2018 ACerS Conference on Electronic and Advanced Materials. He is the Secretary of the ACerS Electronics Division.


Jon’s research interests are in the synthesis, processing, and integration of electroceramic thin films and the resulting functionality. His research areas focus primarily on ferroelectrics, dielectrics, oxide semiconductors, and fast ion conductors.


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