On Aug. 8, 2025, the ACerS International Germany Chapter hosted Byungha Shin, a professor and head of department at KAIST, Korea. His research focuses on in-depth investigation of devices such as transistors, solar cells, and LEDs. His talk on “Electronic Trap Detection with Carrier-Resolved Photo-Hall Effect” was held as part of our (E-)MRS/ACerS-Cologne Materials Lecture Series. Many thanks to Byungha Shin for the highly engaging talk and his visit in Cologne!
