On October 8, 2021, Dr. Orloff introduced the National Institute of Standards and Technology’s (NIST) microwave materials program and discussed a new effort to develop traceable mmWave standard reference materials.
The recording of the webinar is available at this link.
This new standard impacts on-wafer calibration standards, traceable power, phase and impedance. Dr. Orloff discussed cavity perturbation theory, which is a method that’s easy and inexpensive to do. Having introduced NIST’s goals, he reviewed a list of essential equipment needed to perform the on-wafer calibrations.
Nathan (Nate) D. Orloff is the Project Leader of the Microwave Materials Project in the Communications Technology Laboratory at National Institute of Standards and Technology (NIST) in Boulder, Colorado. His research focuses on standards, materials-by-design for communications, 5G standard reference materials, on-wafer materials metrology, and bridging the gap between optical and microwave on-wafer measurement science.