Image-based characterization techniques as such SEM, light microscopy, TEM, and FIB-tomography as well as Micro-tomography have gained an increase in resolution and speed in the past ten years, which make them suitable for microstructural characterization on micro- and nanometer-length scale. Techniques such as µCT, FIB/TEM-tomography, SEM/AFM/ultrasonic microscopy, as well as Digital Image Correlation (DIC), acoustic emission, high energy X-ray synchrotron, and high-performance computing enables an insight 3D view from materials to inspect or detect relative local microstructural changes and damage characteristics. A correlation and synchronization between the sensitivity of these several types of NDE-techniques will close the length scale gap. Thus, physical properties are highly affected by microstructure features (inhomogeneity like porosity, grain borders, inclusions) their size, dimension, shape, and orientation have to be taken into account. Providing microstructure-based models derived from mentioned characterization tools for modelling and simulation will lead to a detailed real structure length scale dependant modelling. Representative volume and volume of interest (VOI) are of particular importance to link model and experiment for verification.

Proposed Session Topics
  • Influence of inhomogeneity on mechanical, chemical, electrical, and thermal properties and the estimations
  • Characterization NDE technologies for defect extraction, shape calculation, grain orientation, and void distribution by 3D-model data acquisition
  • Analysis of sintering and solidification based on image-based models
  • Verification of model by experiment and vice versa
  • Optimized microstructures designed and simulated by topographies
  • Strain characterization by digital image correlation technique
  • Length scale depending modelling based on evaluated structural data

Symposium Organizers
  • Tobias Fey, Friedrich-Alexander-University Erlangen-Nürnberg, Germany
  • You Zhou, National Institute of Advanced Industrial Science and Technology (AIST), Japan
  • Satoshi Tanaka, Nagaoka University of Technology, Japan
  • Alisa Stratulat, ZEISS Research Microscopy Solutions, USA
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