SYMPOSIUM 11 – Materials and Devices for Extreme Environment Microelectronics

This symposium focuses on recent advances and developments in materials and devices for extreme environments microelectronics. Topics of interest include materials and devices for memory and data storage, power electronics, optoelectronics, and detectors for extreme environments that include temperature, pressure, radiation, and chemical stress factors. Contributions that connect material process/structure to device performance are of particular interest.

The goal is to create an international and interdisciplinary forum for researchers from academia, national laboratories, and industry to exchange ideas and foster collaborations. Broad areas of interest include: modeling and simulation to predict device degradation, studies on the role of defects and interfaces in extreme environments, synthesis and fabrication process for environmentally resilient integration. Specific application areas of interest are memory and data storage devices, logic, neuromorphic devices, power electronic devices, and detectors.

Session Topics:

Defects and interfaces in extreme environments
Synthesis, fabrication, and characterization of extreme environment devices
Application-driven properties at high temperature (e.g. non-volatile memory, piezoelectric actuators, power devices, sensors, etc.)
Semiconductors in radiation-heavy environments
Modelling and prediction of properties and degradation in extreme environments

Symposium Organizer(s):

Keisuke Yazawa, Colorado School of Mines, USA

Point(s) of Contact:

Keisuke Yazawa; yazawa@mines.edu

Division Sponsor(s):

Basic Science Division
Electronics Division