SYMPOSIUM 10: Extreme Environment Microelectronics Materials and Devices

This symposium focuses on recent advances and developments in materials and devices for extreme environments. Topics of interest include materials and devices for memory and data storage, power electronics, optoelectronics, and detectors for extreme environments that include temperature, pressure, radiation, and chemical stress factors. Contributions that connect material process/structure to device performance are of particular interest.

Broad areas of interest include: modeling and simulation to predict device degradation, studies on the role of defects and interfaces in extreme environments, synthesis and fabrication process for environmentally resilient integration. Specific application areas of interest are memory and data storage devices, neuromorphic devices, power electronic devices, and detectors.

Proposed Sessions/Topics

• Defects and interfaces in extreme environments
• Synthesis, fabrication, and characterization of extreme environment devices
• Application-driven properties at high temperature (e.g. non-volatile memory, piezoelectric actuators, power devices, sensors, etc.)
• Optoelectronics and detectors in radiation-heavy environments
• Modelling and prediction of properties and degradation in extreme environments

Symposium Organizer(s)

• Brooks Tellekamp, National Renewable Energy Laboratory, USA
• Kei Yazawa, Colorado School of Mines, USA
• Alexey Drobizhev, Lawrence Berkeley National Laboratory, USA

Point(s) of Contact

• Brooks Tellekamp; tellekamp@nrel.gov

Symposium Sponsor(s)

• Basic Science Division
• Electronics Division