SYMPOSIUM 27: Advanced Characterization of Functionalized Low-Dimensional Material Surfaces

This symposium focuses on the synthesis, characterization, and theoretical modeling of functionalized low-dimensional materials on surfaces. It covers innovative synthesis techniques for creating low-dimensional materials such as functional films, nanoparticles, and quantum dots, which have numerous practical applications in batteries, sensors, catalysis, light harvesting, and electronic devices. The symposium highlights state-of-the-art surface-sensitive characterization methods, such as scanning probe microscopies and spectroscopic techniques based on electrons, X-rays, and optics. These advanced methods are crucial for probing the intricate details of material surfaces. A comprehensive understanding of the physical, chemical, optical, and electrical properties of these novel nanomaterials is essential for advancing their applications across various technological fields. By integrating synthesis with characterization and modeling, the symposium aims to foster deeper insights into the behavior and potential of low-dimensional materials, paving the way for their use in electronics, photonics, and energy-related applications. This holistic approach is vital for driving innovation and enhancing the functionality of materials at the nanoscale. 

Proposed Sessions/Topics 

• Electron and X-ray based in situ microscopies and spectroscopies
• Advanced high resolution surface characterization techniques
• Surface electronic properties: STM (Scanning Tunneling Microscopy), KPFM (Kelvin Probe Force Microscopy), TEM (Transmission Electron Microscopy), AES (Auger Electron Spectroscopy).
• Surface photonic properties: XPS (X-ray Photoelectron Spectroscopy), Raman Spectroscopy, UV-Vis-Infrared Spectroscopy
• Surface magnetic properties: MFM (Magnetic Force Microscopy), SMOKE (Surface Magneto Optical Kerr Effect), SPLEEM (Spin polarized low energy electron microscopy), Lorentz electron microscopy PEEM/XMCD, etc.

Symposium Organizer(s) 

• Nozomi Shirato, Argonne National Laboratory, USA 
• Julius De Rojas, Oklahoma State University, USA

Point(s) of Contact 

• Nozomi Shirato; nshirato@anl.gov 

Symposium Sponsor(s) 

• Electronics Division