S.K. Sundaram – Using non-contact methods, such as FTIR, to measure materials propertiesPublished on June 29th, 2009 | By: firstname.lastname@example.org
S.K. Sundaram is chief materials scientist at the Pacific Northwest National Lab. In this video, he discusses several non-contact methods of taking materials measurements. In particular, Sundaram describes the lab’s use of fourier transformed infrared spectroscopy as a rapid screen tool for nanomaterials, such as that being done by PNNL to measure the effect of silica on cell membranes. FTIR is handy for measurements that can exploit bond movements, bends and resonances, but Sundaram also points out that other spectrum ranges can also be used, based on the material being studied and the types of measurements that researchers are seeking.
Sundaram is internationally recognized for interdisciplinary research in the areas of millimeter/THz wave technology, nanomaterials/toxicity, integrated infrared photonics, and materials in extreme environments. He has won numerous awards and honors, including two R&D100 awards. He has held visiting appointments at Harvard, MIT, and Princeton. He is an ACerS and AAAS Fellow, and has authored or coauthored over 75 publications.
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