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December 21st, 2012

New in the Jan-Feb ACerS Bulletin—Testing and characterization of ceramics

Published on December 21st, 2012 | By: Eileen De Guire

On the cover: Cai Zhonghou, beamline scientist at the Advanced Proton Source at Argonne National Laboratory loads a sample into an X-ray nanodiffractometer stage. The cover story reports on the use of the APS to characterize piezoelectric thin films in situ. Credit: W. Agresta; ANL.

Happy New Year!

The January-February 2013 issue of ACerS’ Bulletin magazine will be in members’ mailboxes in the next few days, but you can don’t have to wait—instead, read the latest issue online. We’ve upgraded our e-magazine software, which means the online reading experience is better than ever with bookmarks to your favorite sections, better image resolution, easier navigation, and quick hotlinks to our advertisers.

We start 2013 with the theme: Testing and characterization of ceramics. Feature articles this month include

This issue includes articles about the Society’s new president and its rising research stars:

Plus, the ACerS Bulletin is your best resource for news about the ceramics industry and the Society.

Be sure, too, to peruse the meeting guides for the Electronic Materials and Applications conference (Jan. 23-25) in Orlando, Fla. and the 37th International Conference on Advanced Ceramics and Composites (Jan. 27-Feb. 1) in Daytona Beach, Fla.

The current issue is open to all, and back issues are available to ACerS members by simply logging in to the ceramics.org website. Join ACerS today and get access to all the back issues of the ACerS Bulletin!

Coming in March to the Bulletin: Defense applications for ceramics and glass.


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