Abstract:
The advancement of new technologies in recent decades has enabled a variety of new in-situ/operando techniques to study the materials behavior and microstructure evolutions in real time. The external stimulus can be in many forms, including heating or cooling, mechanical stress, light exposure, electric or/and magnetic fields, reactive gas or liquid environments, and ion irradiation, for example. By capturing the real-time materials evolutions under certain external stimulus using in-situ/operando characterization techniques, we can understand the functionality and device operation mechanisms fundamentally in their proposed working environments, which undoubtedly facilitate the development of novel material systems and devices for various technological applications.
This symposium focuses on the recent progress and development of using in-situ/operando techniques to characterize functional and structural materials and devices. These techniques use photon, electron, neutron, and X-ray to probe materials and devices, including but not limited to transmission electron microscopy, X-ray and neutron diffraction/reflectivity, atomic force microscopy, and synchrotron techniques.
Proposed sessions/topics:
In operando study of advanced functional materials including transition metal oxides, transition metal dichalcogenides, halide perovskites and so on.
• Study of electronic materials such as Mott insulators, dielectrics, ionics, ferroics, semiconductors, superconductors etc. using advanced characterization techniques.
• In operando study of device performances and behaviors including batteries, fuel cells, solar cells, memristors, memory devices and so on.
• Study of nanomaterial-based catalysts at reactive environments
• Real-time investigation of mechanical properties in structural materials.
• Advances in developing in situ characterization techniques related to electron microscopy, X-ray, and neutron characterization techniques.
Lead Organizers:
Di Zhang, University of Texas at Arlington, USA, di.zhang@uta.edu
Hao Zheng, Argonne National Laboratory, USA, hao.zheng@anl.gov
Alessandro Mazza, Los Alamos National Laboratory, USA, armazza@lanl.gov
Katherine Harmon, Stanford University, USA, kharmon@stanford.edu
Sponsored By
