Bryan Huey is an expert in developing and applying advances in Atomic Force Microscopy. Following his B.S. in Materials Science and Engineering at Stanford University in 1993 and a brief time with Acuson working on ultrasonic transducers, he began using AFM in Dawn Bonnell’s group at the University of Pennsylvania where he completed his PhD in 1999. There he developed methods for laser based nanooxidation of Ti thin films with W. Pompe (Dresden), and also achieved the first nanoscale measurements of potential barriers in varistors using Scanning Surface Potential Microscopy. As an NSF-international postdoc, and later a Marshall Sherfield fellow, he worked with A. Briggs and O. Kolosov at Oxford University to develop Ultrasonic Force Microscopy for mechanical mapping of semiconducting materials. After a 6 month visit to EPFL with A. Kulik extending this work, he moved to the NIST Ceramics Division as an NRC postdoc to join J. Blendell investigating ferroelectrics and piezoelectrics. In 2004, he joined the MS&E faculty at the University of Connecticut, where he is presently the UTC Professor of Engineering Innovation. Huey’s research group, the ‘nmLabs,’ specializes in high speed and lately tomographic AFM, multiferroics and ferroelectrics, inorganic as well as molecular perovskite solar cells, and nano-bio-mechanics, with notable papers in Nature, Nanoletters, Nanotechnology, APL, JPCL, and JACerS.
Bryan is also the past chair of the Basic Science Division of The American Ceramic Society, a prior co-organizer of the EMA conference, and a co-organizer for the 2017 US-Japan dielectrics meeting. He was a Velux Visiting Professor to Aarhus University as well, at iNANO with F. Besenbacher in 2012. At UConn Bryan is the MS&E graduate program director. He is regularly recognized for his teaching, including as an invited participant to the NAE’s Frontiers of Engineering Education program, and for his innovative ‘Nanoscience and Society’ course.