Video: Creating ultrasharp STM, AFM probes for superior resolution and durability

By / July 10, 2012

Researchers at the University of Illinois have literally made a pointed improvement in microscopic probe tips. Led by Joe Lyding, a professor of electrical and computer engineering, the investigators developed a new microscope probe-sharpening technique that can improve and retain the resolution of  scanning tunneling atomic force microscopy and improve the workflow by cutting tip replacement downtime. According…

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